Features:
- 5.7-inch, VGA color TFT display and LEMO/BNC probe connector.
- Wide measurement ranges from 1-10000 mm.
- Precise and stable horizontal and vertical linearity with horizontal linearity 0.1% and vertical linearity 2%.
- DAC, AVG, DGS curves and defect echo help to evaluate defect equivalent calculation.
- Simultaneous display of high-resolution A-scan and B-scan waveform.
- Four ways to present waveform: positive half-wave, negative half- wave, full wave and radio frequency.
- Automatic gain adjustment, defect equivalent calculation and peak memory function.
- Two individual gates setting and alarming function.
- Gate measurement includes echo amplitude, beam path, depth, projection and so on.
- Waveform freeze available in full, peak, comparative and envelope ways.
- 50 detecting channels are available with separate detecting parameters and DAC (Distance Amplitude Correction) curves in every channel.
- Adjustable high performance square wave pulse generator
- Three detecting modes (single-probe, dual crystal probe and transmission) with automatic calibration function.
- Connected to PC via USB interface with advanced software for data analysis and management.
- Super large memory, 1000 waveform and 4X2000 frame dynamic waveform diagrams can be stored, with the function of storage, checkout and review of channel, waveform, dynamic records.
- Flaw detection report printable.
Technical Specifications:
| Operating temperature | -10℃~+50℃ |
| Storage temperature | -20℃~+60℃ |
| Language | English/Chinese/Spanish selectable |
| Probe socket | LEMO or BNC |
| Battery (mAh) | 2×3.7V 5000mAh |
| Battery working time | >8h |
| Charging time (h) | <8h |
| Power adapter Input | 100-240~50/60Hz |
| Output | 9V DC/3A~4A |
| LCD | Color transmission TFT, 640×480 |
| Dimension (mm) | 177X255X51 |
| Weight (g) | 1200 |
| Basic | Receiver | ||
| Measuring unit | mm/inch/μs | Gain (dB) | 0~110 |
| Scanning range (mm) | 0-10000 | Bandwidth (MHz) | 0.5~15 |
| Sound velocity (m/s) | 600-16000 | Rectify | Positive half wave, negative half wave, full and RF |
| P-delay (μs) | -1.000~750.000 | Vertical linearity accuracy | ±2% |
| D-delay (μs) | -20~+3400 | Amplifier resolution (dB) | ±1 |
| Test mode | Pulse-echo, dual and through transmission | Rejection (1%) | Linear, 0~80% of the full screen |
| Scanning mode | A scan and B scan, displaying both simultaneously | Sampling frequency (MHz) | 80 |
| Pulse generator | Crosstalk rejection (dB) | ≥80 | |
| Pulser (V) | Square pulse | Dead zone (μs) | ≤10 (related with transmitting) |
| Transmitting voltage | 100~400(V) variable in steps of 10V | Dynamic range (dB) | ≥40 |
| Transmitting pulse width (ns) | 75/100~500 variable in steps of 50ns | Instant resolution (dB) | ≥32 |
| Damping (Ω) | 50/100/200/500 | Time base linearity | <±0.2% full screen |
| Pulse repetition frequency (Hz) | 10~1000 | Sensitivity leavings (dB) | ≥62 |
| Measurements and others | Data management, communication and print | ||
| Gate | 2 independent gates | Data storage Data management |
50 channels |
| Testing position | Edge, Peak value | 1000 wave images (including 980 A scan images and 20 B scan images) | |
| Gate measurements | Echo amplitude, Sound path, depth, projection etc. | 4×2000 dynamic wave image | |
| Freeze | Freeze waveform, peak value, comparative and envelope | Store, review or replay the channels, waves | |
| AVG equivalent calculate | Calculate the flaw equivalent according to the flaw echo and AVG curve | All the data can be stored to PC or flash disk | |
| DAC flaw evaluating | Make flaw evaluation according to flaw echo and DAC curve | Communication | Communicate with PC via USB interface |
| Gate logic | Off, measurement, gate positive wave alarm, gate negative wave alarm | Printing | Print report |
| Gate alarm | off, anytime, hold for 0.2s, 0.5s, 1s and 2s, lock | Output port | |
| Alarm | on/off | USB OTG port | USB 2.0 device connected with PC USB 2.0 host connected with flash disk or printer |
